CÔNG TY TNHH THIẾT BỊ KHOA HỌC KỸ THUẬT AN DƯƠNG
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Giá bán: Đang cập nhật
Liên hệ ngayStatic optical fault
isolation solution for semiconductor failure analysis and service labs.
Applications
Semiconductor research
and development
Semiconductor Failure
Analysis
Key Features
Fault Diagnostic with
Active Probe Technology
High-sensitivity,
lock-in capable, noise-eliminating static laser stimulation/optical beam
induced resistance change (SLS/OBIRCH) detection enabled by Fault Diagnostic
with Active Probe Technology.
Photon emission
Photon
emission options spanning a range of sensitivity requirements for isolating
shorts, detecting areas of excess leakage, and mapping active regions.
Ease-of use
Probing
setup and software designed for ease-of-use and productivity.
Scalable and
upgradable
Fully
scalable and upgradable optical platform.
Specifications
|
Inverted
optical system |
|
Combo system: LSM + PEM standard, with optional LSM-only or
PEM-only configurations |
|
220VAC,
50Hz/60Hz |
|
Standard 9” x 9” load board interface, plus customizable
alternatives |
|
Dual-side
microprobing and Probe Card configurations available |
|
Stage repeatability ≤2μm |
|
Optional
laser marker for defect redetection |
For more detail information of Meridian S System, please visit the website: https://www.thermofisher.com/vn/en/home/electron-microscopy/products/electrical-failure-analysis-systems/meridian-s.html
Or directly contact to ADGroup
