+84 2438612612
CÔNG TY TNHH THIẾT BỊ KHOA HỌC KỸ THUẬT AN DƯƠNG
info@adgroup.vn
Colorlib Template

Phổ kế quang điện tử tia X NEXSA

Hãng sản xuất: Thermo Fisher Scientific

Giá bán: Đang cập nhật

Liên hệ ngay

X-Ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities.


The Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. Integration of multiple analytical techniques, such as ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development, and many other applications.

Current Time 0:00
Duration 7:46
Loaded2.14%
 

Webinar: Thermo Scientific Nexsa Surface Analysis System

Key Features

High-performance X-ray source

High-performance X-ray source

A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.

Optimized electron optics

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing

Sample viewing

Bring sample features into focus with the Nexsa XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image. 

Insulator analysis

Insulator analysis

The patented dual-beam flood source couples low-energy ion beams with very low-energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need for charge referencing, making the analysis of the data from insulating samples easy and reliable. 

Depth profiling

Depth profiling

Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Optional sample holders

Optional sample holders

Specialist sample holders for angel-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Digital Control

Digital Control

Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system. 

 

Specifications

Analyzer type
  • 180°, double-focusing, hemispherical analyzer with 128-channel detector
X-ray source type
  • Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size
  • 10–400 µm (adjustable in 5 µm steps)
Depth profiling
  • EX06 monatomic ion source or MAGCIS dual-mode ion source
Maximum Sample area
  • 60 x 60 mm
Maximum sample thickness
  • 20 mm 
Vacuum system
  • Two turbo molecular pumps, with automated titanium sublimation pump and backing pump 
Optional accessories
  • UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, sample bias module, vacuum transfer module, adaptor for glove box integration 

Sản phẩm liên quan