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Liên hệ ngayThe Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. Integration of multiple analytical techniques, such as ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development, and many other applications.
Webinar: Thermo Scientific Nexsa Surface Analysis System
A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
Bring sample features into focus with the Nexsa XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.
The patented dual-beam flood source couples low-energy ion beams with very low-energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need for charge referencing, making the analysis of the data from insulating samples easy and reliable.
Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Specialist sample holders for angel-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.
Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system.
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| X-ray source type |
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| X-ray spot size |
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| Depth profiling |
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| Maximum Sample area |
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| Maximum sample thickness |
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| Vacuum system |
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| Optional accessories |
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