Helios G4 CX DualBeam for Materials Science

Access the highest-resolution, multi-scale, and multi-modal subsurface and 3D information

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The latest technological innovations of the Helios G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and Thermo Scientific's application expertise, allow the Helios G4 CX DualBeam with optional AS&V4 software for the highest-quality, fully automated acquisition of multi-modal 3D datasets. Combined with Avizo visualization software, it delivers a unique workflow solution for highest-resolution, advanced 3D characterization and analysis at nanometer scale.

Experience the Advantages of the Helios G4 CX DualBeam

Fastest and easiest preparation of high-quality, site-specific TEM and APT samples using the Tomahawk ion column
Shortest time to nanoscale information using best-in-class Elstar™ electron column
The most complete sample information with sharp, refined, and charge-free contrast obtained from up to 7 integrated in-column and below-the-lens detectors.
The highest quality, multi-modal subsurface and 3D information with the most precise targeting of the region of interest using optional Auto Slice & View™ 4 (AS&V4) software.
Fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm
Precise sample navigation tailored to individual application needs thanks to the high flexibility 110 mm stage and in-chamber Nav-Cam
Artifact-free imaging based on integrated sample cleanliness management and dedicated imaging modes such as SmartScan™

Featured Event

Webinar: Advanced DualBeam automation for every need

Register for our exclusive webinar to learn how easy it has become to automate daily routine tasks on your DualBeam instrument using our Python-based AutoScript 4 API. Automation can also increase throughput, reproducibility and ease of use, quicken time to data and boost efficiency.

Event Date: Thursday, June 28 at 8:00 AM PDT.

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Sample surface prepared for 3D data acquisition using the Helios G4 CX DualBeam and AS&V4.

Alumina nanospheres imaged at 700 V using Helios G4 DualBeam. Image courtesy of Mark Darus, Thermo Fisher Scientific.

High-quality TEM lamella produced with the Helios G4 CX DualBeam in 45 minutes using iFast-based guided TEM sample preparation workflow.

Featured Document

Helios G4 CX DualBeam Datasheet

Helios G4 CX is part of the fourth generation of the industry-leading Helios DualBeam™ family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar electron column for ultra-high-resolution imaging and highest materials contrast with the superior Tomahawk ion column for the fastest, easiest, and most precise high-quality sample preparation and 3D characterization, even on the most challenging samples.

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