Non-destructive Technology

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  • Thứ năm, 06/06/2013

    Xradia's VersaXRM provides an unparalleled combination of contrast and resolution for all types of materials science. From carbon fiber composite to high temperature ceramics to exotic metal alloys, ...

    Thứ năm, 06/06/2013

    <p><strong>FIB/SEMs for sample prep and microanalysis</strong></p>
    <p>FEI's DualBeam™ (FIB/SEM) systems are the preferred solution for 3D  microscopy and ...

    Thứ năm, 06/06/2013

    Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around ...